Dopant Diffusion in Sequentially Doped Poly(3-hexylthiophene) Studied by Infrared and Photoelectron Spectroscopy-Reference-Cited by-同舟云学术

Dopant Diffusion in Sequentially Doped Poly(3-hexylthiophene) Studied by Infrared and Photoelectron Spectroscopy

Published:2018-06-08 Issue:26 Volume:122 Page:14518-14527
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Reiser Patrick¹²,Müller Lars²³⁴^ORCID,Sivanesan Vipilan²³,Lovrincic Robert²⁴^ORCID,Barlow Stephen⁵^ORCID,Marder Seth R.⁵^ORCID,Pucci Annemarie²³⁶^ORCID,Jaegermann Wolfram¹²,Mankel Eric¹²^ORCID,Beck Sebastian²³^ORCID

Affiliation:

1. Materials Science Department, Surface Science Division, TU Darmstadt, Otto-Berndt-Straße 3, 64287 Darmstadt, Germany

2. InnovationLab, Speyerer Straße 4, 69115 Heidelberg, Germany

3. Kirchhoff Institute for Physics, Heidelberg University, Im Neuenheimer Feld 227, 69120 Heidelberg, Germany

4. Institute for High-Frequency Technology, TU Braunschweig, Schleinitzstr. 22, 38106 Braunschweig, Germany

5. Center for Organic Photonics and Electronics and School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, Georgia 30332-0400, United States

6. Centre for Advanced Materials, Heidelberg University, Im Neuenheimer Feld 225, 69120 Heidelberg, Germany

Funder

Bundesministerium f?r Bildung und Forschung

Carl-Zeiss-Stiftung

Division of Materials Research

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.8b02657

Reference62 articles.