Evaluating the Internal Structure of Core–Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra-Reference-Cited by-同舟云学术

Evaluating the Internal Structure of Core–Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra

Published:2015-07-29 Issue:31 Volume:119 Page:17687-17696
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Chudzicki M.¹,Werner W. S. M.¹,Shard A. G.²,Wang Y.-C.³,Castner D. G.³,Powell C. J.⁴

Affiliation:

1. Technische Universität Wien, Institut für Angewandte Physik, Wiedner Hauptstraβe 8-10, A-1040 Vienna, Austria

2. National Physical Laboratory, Hampton Road, Teddington, Middlesex TW11 0LW, U.K.

3. National ESCA and Surface Analysis Center for Biomedical Problems, Departments of Chemical Engineering and Bioengineering, University of Washington, Seattle, Washington 98195-1653, United States

4. Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8370, United States

Funder

National Science Foundation

National Institute of Biomedical Imaging and Bioengineering

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.5b04517

Reference48 articles.

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2. XPS and angle resolved XPS, in the semiconductor industry: Characterization and metrology control of ultra-thin films

3. Ratner, B.; Castner, D. G.InSurface Analysis: The Principal Techniques;Vickerman, J. C.; Gilmore, I. S., Eds.John Wiley & Sons, Ltd:Chichester, U.K., 2009; pp47–112.

4. Quantitative Determination of Ligand Densities on Nanomaterials by X-ray Photoelectron Spectroscopy

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