Probing the Interfacial Charge-Transfer Process of Uniform ALD Semiconductor–Molecule–Metal Models: A SERS Study-Reference-Cited by-同舟云学术

Probing the Interfacial Charge-Transfer Process of Uniform ALD Semiconductor–Molecule–Metal Models: A SERS Study

Published:2017-11-22 Issue:48 Volume:121 Page:26939-26948
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Zhang Xiaolei¹²,Liu Yaoze²,Soltani Mohammad²,Li Peng¹,Zhao Bing¹^ORCID,Cui Bo²

Affiliation:

1. State Key Laboratory of Supramolecular Structure and Materials, Jilin University, Changchun 130012, P. R. China

2. Department of Electrical and Computer Engineering and Waterloo Institute for Nanotechnology (WIN), University of Waterloo, Waterloo, Ontario N2L 3G1, Canada

Funder

State Administration of Foreign Experts Affairs

Ministry of Education of the People's Republic of China

National Natural Science Foundation of China

Jilin Province

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.7b10086

Reference39 articles.

1. Electrical characterization of metal–molecule–silicon junctions

2. Nature of electrical contacts in a metal–molecule–semiconductor system

3. Effect of Molecular Binding to a Semiconductor on Metal/Molecule/Semiconductor Junction Behavior

4. In situ Structural Characterization of Metal−Molecule−Silicon Junctions Using Backside Infrared Spectroscopy

5. Localized Surface Plasmon Resonance Nanosensor: A High-Resolution Distance-Dependence Study Using Atomic Layer Deposition

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