Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO3 by Argon Cluster Sputtering-Reference-Cited by-同舟云学术

Enhanced Depth Profiling of Perovskite Oxide: Low Defect Levels Induced in SrTiO3 by Argon Cluster Sputtering

Published:2016-09-15 Issue:38 Volume:120 Page:21358-21363
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Ridier Karl¹²,Aureau Damien²,Bérini Bruno¹,Dumont Yves¹,Keller Niels¹,Vigneron Jackie²,Etcheberry Arnaud²,Fouchet Arnaud¹

Affiliation:

1. Groupe d’Étude de la Matière Condensée (UMR 8635), Université de Versailles Saint-Quentin-en-Yvelines—CNRS—Université Paris-Saclay, 45 Avenue des États-Unis 78035 Versailles, France

2. Institut Lavoisier de Versailles (UMR 8180), Université de Versailles Saint-Quentin-en-Yvelines—CNRS—Université Paris-Saclay, 45 Avenue des États-Unis 78035 Versailles, France

Funder

Agence Nationale de la Recherche

Région Île-de-France

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.6b04007

Reference41 articles.

1. Ferroelectricity at the Nanoscale: Local Polarization in Oxide Thin Films and Heterostructures

2. Two-dimensional electron gas with universal subbands at the surface of SrTiO3