Estimation of Charge-Injection Barriers at the Metal/Pentacene Interface through Accumulated Charge Measurement
Author:
Affiliation:
1. Graduate School of Material Science, University of Hyogo, 3-2-1 Koto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan
2. Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2280, Japan
Funder
Ministry of Education, Culture, Sports, Science and Technology
Publisher
American Chemical Society (ACS)
Subject
Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.6b12215
Reference43 articles.
1. Pentacene transistor encapsulated by poly-para-xylylene behaving as gate dielectric insulator and passivation film
2. Reduction of the contact resistance by doping in pentacene few monolayers thin film transistors and self-assembled nanocrystals
3. Charge injection process in organic field-effect transistors
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