Band Gap Narrowing in Silane-Grafted ZnO Nanocrystals. A Comprehensive Study by Wide-Angle X-ray Total Scattering Methods

Author:

Bertolotti Federica1ORCID,Tǎbǎcaru Aurel2ORCID,Muşat Viorica2ORCID,Ţigǎu Nicolae2,Cervellino Antonio3ORCID,Masciocchi Norberto1ORCID,Guagliardi Antonietta4ORCID

Affiliation:

1. Dipartimento di Scienza e Alta Tecnologia and To.Sca.Lab, Università dell’Insubria, via Valleggio 11, Como, I-22100, Italy

2. Center of Nanostructures and Functional Materials − CNMF, Department of Materials Science and Engineering, Faculty of Engineering, Dunǎrea de Jos University of Galati, 111 Domneasca Street, Galati, 800201, Romania

3. SLS, Laboratory for Synchrotron Radiation-Condensed Matter, Paul Scherrer Institut, Villigen, CH-5232, Switzerland

4. Istituto di Cristallografia and To.Sca.Lab, Consiglio Nazionale delle Ricerche, via Valleggio 11, Como, I-22100, Italy

Funder

Ministero dell'Istruzione, dell'Universit? e della Ricerca

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

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