Monitoring Fast Thermal Dynamics at the Nanoscale through Frequency Domain Photoinduced Force Microscopy-Reference-Cited by-同舟云学术

Monitoring Fast Thermal Dynamics at the Nanoscale through Frequency Domain Photoinduced Force Microscopy

Author:

Kim Bongsu¹,Jahng Junghoon²,Sifat Abid³,Lee Eun Seong²^ORCID,Potma Eric O.¹³^ORCID

Affiliation:

1. Department of Chemistry, University of California, Irvine, California 92697, United States

2. Hyperspectral Nano-imaging Lab, Korea Research Institute of Standards and Science, Daejeon 34113, South Korea

3. Department of Electrical Engineering & Computer Sciences, University of California, Irvine, California 92697, United States

Funder

Division of Chemistry

National Research Foundation of Korea

Institute for Information and Communications Technology Promotion

Division of Civil, Mechanical and Manufacturing Innovation

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

Reference29 articles.

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