Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2

Author:

de Boer Tristan1ORCID,Häusler Jonas2,Strobel Philipp3,Boyko Teak D.4ORCID,Rudel Stefan S.2,Schnick Wolfgang2ORCID,Moewes Alexander1ORCID

Affiliation:

1. Department of Physics and Engineering Physics, University of Saskatchewan, S7N 5E2 Saskatoon, Saskatchewan, Canada

2. Department of Chemistry, University of Munich (LMU), Butenandtstrasse 5-13, 81377 Munich, Germany

3. Lumileds Germany, Philipsstrasse 8, D-52068 Aachen, Germany

4. Canadian Light Source, S7N 2V3 Saskatoon, Saskatchewan, Canada

Funder

Canadian Institutes of Health Research

National Research Council Canada

Canada Foundation for Innovation

Deutsche Forschungsgemeinschaft

University of Saskatchewan

Natural Sciences and Engineering Research Council of Canada

Government of Saskatchewan

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

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