Shifted Morphotropic Phase Boundary in [111]-Oriented Nb-Doped Pb(ZrxTi1–x)O3 Epitaxial Films: Insights into Piezoelectricity and Domain Variation-Reference-Cited by-同舟云学术

Shifted Morphotropic Phase Boundary in [111]-Oriented Nb-Doped Pb(ZrxTi1–x)O3 Epitaxial Films: Insights into Piezoelectricity and Domain Variation

Published:2015-08-14 Issue:34 Volume:119 Page:19891-19896
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Sun Wei¹,Yu Qi¹,Li Jiangyu²,Li Jing-Feng¹

Affiliation:

1. State Key Laboratory of New Ceramics and Fine Processing, School of Materials Science and Engineering, Tsinghua University, 100084 Beijing, People’s Republic of China

2. Department of Mechanical Engineering, University of Washington, Seattle, Washington 98195-2600, United States

Funder

Division of Civil, Mechanical and Manufacturing Innovation

National Natural Science Foundation of China

Ministry of Science and Technology of the People's Republic of China

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.5b05423

Reference33 articles.

1. PROCESSING AND CHARACTERIZATION OF PIEZOELECTRIC MATERIALS AND INTEGRATION INTO MICROELECTROMECHANICAL SYSTEMS

2. Ferroelectric thin films: Review of materials, properties, and applications

3. Piezoelectric Properties of Lead Zirconate‐Lead Titanate Solid‐Solution Ceramics

4. Processing, Structure, Properties, and Applications of PZT Thin Films

5. Phase transitions and thermal-stress-induced structural changes in a ferroelectric Pb(Zr0.80Ti0.20)O3single crystal

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