Unveiling the Critical Relationship between MXene Double-Layer Capacitance and Electronic Configuration

Author:

Shou Hongwei12,Zhou Quan1,Zhang Pengjun1,Cui Qilong1,Chen Shuangming1ORCID,Wei Shiqiang1,Chimtali Peter J.1,Wu Xiaojun2ORCID,Song Li13ORCID

Affiliation:

1. National Synchrotron Radiation Laboratory, CAS Center for Excellence in Nanoscience, University of Science and Technology of China, Hefei 230029, P. R. China

2. Key Laboratory of Precision and Intelligent Chemistry, CAS Key Laboratory for Materials for Energy Conversion, School of Chemistry and Materials Science, and Innovation Center of Chemistry for Energy Materials (iChem), University of Science and Technology of China, Hefei 230026, P. R. China

3. Zhejiang Institute of Photonelectronics, Jinhua 321004, Zhejiang, P. R. China

Funder

National Key Research and Development Program of China

National Postdoctoral Program for Innovative Talents

National Science Fund for Distinguished Young Scholars

Fundamental Research Funds for the Central Universities

National Natural Science Foundation of China

Chinese Academy of Sciences

Publisher

American Chemical Society (ACS)

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