Intelligent Agents for the Optimization of Atomic Layer Deposition

Author:

Paulson Noah H.1ORCID,Yanguas-Gil Angel1,Abuomar Osama Y.2,Elam Jeffrey W.1ORCID

Affiliation:

1. Applied Materials Division, Argonne National Laboratory, Argonne, Illinois 60439, United States

2. Department of Engineering, Computing, and Mathematical Sciences, Lewis University, Romeoville, Illinois 60446, United States

Funder

Argonne National Laboratory

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Examination of nonideal film growth in batch atomic layer deposition for plasma-resistant coatings;Journal of Vacuum Science & Technology A;2024-09-09

2. Assessing the Environmental Impact of Atomic Layer Deposition (ALD) Processes and Pathways to Lower It;ACS Materials Au;2023-04-27

3. How to build an effective self-driving laboratory;MRS Bulletin;2023-02

4. Scaling-Up of Thin-Film Photoelectrodes for Solar Water Splitting Based on Atomic Layer Deposition;ACS Applied Materials & Interfaces;2022-12-20

5. Intelligent Tourism System Based on Android Platform;2022 IEEE 2nd International Conference on Mobile Networks and Wireless Communications (ICMNWC);2022-12-02

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