Spectromicroscopy of Poly(ethylene terephthalate): Comparison of Spectra and Radiation Damage Rates in X-ray Absorption and Electron Energy Loss-Reference-Cited by-同舟云学术

Spectromicroscopy of Poly(ethylene terephthalate): Comparison of Spectra and Radiation Damage Rates in X-ray Absorption and Electron Energy Loss

Published:1997-03-01 Issue:11 Volume:101 Page:1950-1960
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Rightor E. G.¹,Hitchcock A. P.¹,Ade H.¹,Leapman R. D.¹,Urquhart S. G.¹,Smith A. P.¹,Mitchell G.¹,Fischer D.¹,Shin H. J.¹,Warwick T.¹

Affiliation:

1. Analytical Sciences, B-1470, Dow Chemical, Freeport, Texas 77541, Department of Chemistry, McMaster University, Hamilton Ontario, Canada L8S 4M1, Department of Physics, North Carolina State University, Raleigh, North Carolina 27695, National Institutes of Health, BEIP, NCRR, Bethesda, Maryland 20892, Analytical Sciences Bldg. 1897, Dow Chemical, Midland, Michigan 48667, Material Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, Pohang Light...

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp9622748

Reference60 articles.

1. Polymer/metal interfaces studied by carbon near‐edge x‐ray absorption fine structure spectroscopy

2. Polarized XANES studies of oriented polyethylene and fluorinated polyethylenes

3. Determination of surface structure and orientation of polymerized tetrafluoroethylene films by near-edge x-ray absorption fine structure, x-ray photoelectron spectroscopy, and static secondary ion mass spectrometry

4. Springer Series in Surface Science No;Stöhr J.,1992

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