Raman Microspectrometry Study of Electrochemical Lithium Intercalation into Sputtered Crystalline V2O5 Thin Films-Reference-Cited by-同舟云学术

Raman Microspectrometry Study of Electrochemical Lithium Intercalation into Sputtered Crystalline V2O5 Thin Films

Published:2008-02-19 Issue:5 Volume:20 Page:1916-1923
ISSN:0897-4756
Container-title:Chemistry of Materials
language:en
Short-container-title:Chem. Mater.

Author:

Baddour-Hadjean R.¹,Pereira-Ramos J. P.¹,Navone C.¹,Smirnov M.¹

Affiliation:

1. Institut de Chimie et Matériaux Paris-Est, Unité Mixte de Recherche (UMR) 7182 Centre National de la Recherche Scientifique (CNRS) et Université Paris XII, GESMAT, 2 rue Henri Dunant 94320 Thiais, France, Fock Institute of Physics, St. Petersburg State University, 198504 - St. Petersburg, Russia

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/cm702979k

Reference31 articles.

1. Thin-film rechargeable lithium batteries

2. Charging Capacity and Cycling Stability of VO x Films Prepared by Pulsed Laser Deposition

3. Electrochemical properties of vanadium oxide thin film deposited by R.F. sputtering

4. RF-Sputtered Vanadium Oxide Films

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