Simultaneous Determination of Thicknesses and Refractive Indices of Ultrathin Films by Multiple Incidence Medium Ellipsometry
Author:
Affiliation:
1. Institute of Applied Synthetic Chemistry, Vienna University of Technology, Getreidemarkt 9, A-1060 Wien, Austria
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp025722m
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1. Ellipsometry and polarized light
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5. Ellipsometry Studies of the Self-Assembly of Nonionic Surfactants at the Silica-Water Interface: Equilibrium Aspects
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