Combined Atomic Force Microscope-Based Topographical Imaging and Nanometer-Scale Resolved Proximal Probe Thermal Desorption/Electrospray Ionization–Mass Spectrometry-Reference-Cited by-同舟云学术

Combined Atomic Force Microscope-Based Topographical Imaging and Nanometer-Scale Resolved Proximal Probe Thermal Desorption/Electrospray Ionization–Mass Spectrometry

Published:2011-06-06 Issue:7 Volume:5 Page:5526-5531
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Ovchinnikova Olga S.¹²,Nikiforov Maxim P.³,Bradshaw James A.¹,Jesse Stephen³,Van Berkel Gary J.¹²

Affiliation:

1. Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States

2. Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996-1200, United States

3. Imaging Functionality Group, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6487, United States

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn200939e

Reference20 articles.

1. Thin-layer chromatography and mass spectrometry coupled using proximal probe thermal desorption with electrospray or atmospheric pressure chemical ionization

2. Molecular Surface Sampling and Chemical Imaging using Proximal Probe Thermal Desorption/Secondary Ionization Mass Spectrometry

3. Established and emerging atmospheric pressure surface sampling/ionization techniques for mass spectrometry

4. Recent developments in ambient ionization techniques for analytical mass spectrometry

5. Ambient desorption ionization mass spectrometry

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