Molecular Surface Sampling and Chemical Imaging using Proximal Probe Thermal Desorption/Secondary Ionization Mass Spectrometry-Reference-Cited by-同舟云学术

Molecular Surface Sampling and Chemical Imaging using Proximal Probe Thermal Desorption/Secondary Ionization Mass Spectrometry

Published:2010-12-15 Issue:2 Volume:83 Page:598-603
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Ovchinnikova Olga S.¹,Kertesz Vilmos¹,Van Berkel Gary J.¹

Affiliation:

1. Organic and Biological Mass Spectrometry Group, Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6131, United States, and Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996-1200, United States

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac102766w

Reference19 articles.

1. Thin-layer chromatography and mass spectrometry coupled using proximal probe thermal desorption with electrospray or atmospheric pressure chemical ionization

2. Established and emerging atmospheric pressure surface sampling/ionization techniques for mass spectrometry

3. Recent developments in ambient ionization techniques for analytical mass spectrometry

4. Ambient desorption ionization mass spectrometry

5. What can we learn from ambient ionization techniques?

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