Diffraction topography using white X-ray beams with low effective divergence-Reference-Cited by-同舟云学术

Diffraction topography using white X-ray beams with low effective divergence

Published:1999-10 Issue:1761 Volume:357 Page:2741-2754
ISSN:1364-503X
Container-title:Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences
language:en
Short-container-title:Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences

Author:

Baruchel José¹,Cloetens Peter¹,Härtwig Jürgen¹,Schlenker Michel²

Affiliation:

1. European Synchrotron Radiation Facility, BP 220, 38043 Grenoble, France

2. Laboratoire Louis Néel, CNRS, BP 166, 38042 Grenoble, France

Publisher

The Royal Society

Subject

General Physics and Astronomy,General Engineering,General Mathematics

Link

https://royalsocietypublishing.org/doi/pdf/10.1098/rsta.1999.0463

Reference26 articles.

1. Baruchel J. 1996 In X-ray and neutron dynamical diffraction: theory and applications (ed. A. Authier S. Lagomarsino & B. K. Tanner) pp. 399-409. New York: Plenum Press.

2. First topographic results at the European synchrotron radiation facility

3. Phase objects in synchrotron radiation hard x-ray imaging

4. Fractional Talbot imaging of phase gratings with hard x rays

5. Observation of microstructure and damage in materials by phase sensitive radiography and tomography

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