X-ray diffraction imaging investigation of silicon carbide on insulator structures-Reference-Cited by-同舟云学术

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X-ray diffraction imaging investigation of silicon carbide on insulator structures

Published:2002-11-01 Issue:5 Volume:75 Page:621-627
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Milita S.,Le Tiec Y.,Pernot E.,Di Cioccio L.,Härtwig J.,Baruchel J.,Servidori M.,Letertre F.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390101132.pdf

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. White X-ray beam topography and radiography of Si1-xGexcrystals bonded to silicon;physica status solidi (a);2007-08

4. Direct bonding of silicon carbide wafers with a regular relief at the interface;Technical Physics Letters;2006-05

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