The Clifford Paterson Lecture, 1986 - Limits of thin-film microfabrication

Author:

Abstract

Thin-film microfabrication techniques are used to make semiconductor integated circuits, integrated optical devices, thin-film magnetic recording heads, and a variety of other devices of commercial and scientific interest. The dimensional accuracy that can be achieved with the techniques frequently determines whether or not devices can be built, and it is almost always a major influence on device performance. In addition, the commercial viability of most devices depends on the cost, and the speed of the fabrication methods. This lecture discusses the practical and theoretical limits of thin-film fabrication processes. Emphasis is placed on ultraviolet light, X-ray, electron and ion lithographies. Ultimately, it is possible to build structures with dimensions of only a few atomic diameters. These so-called ‘nanostructures’ are being used in a variety of scientific investigations. Their fabrication, which is described, illustrates the limits to fabrication capability.

Publisher

The Royal Society

Subject

Pharmacology (medical)

Reference14 articles.

1. EBES4: A new electron-beam exposure system

2. Broers A. N. 1975 In Scanning electron microscopy/1975 (ed. 0 . Jo h ari & J . Corvin) pp. 661-670. Chicago: II T R esearch In stitu te .

3. Scanning electron beam method for examining surfaces in a short focal length magnetic lens

4. Broers A. N. & Laibowitz R. B. 1978 In Future trends in superconductive electronics (ed. B. S. D eavor J r. et al.) pp. 289-297. New Y ork: A m erican In s titu te of Physics.

5. Broers A. N. & Sedgwick T. 0 . 1976 U nited S tates P a te n t 3971860.

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Ontology and Nanotechnologies;Electrotehnica, Electronica, Automatica;2023-08-15

2. What is nanotechnology?;Nanotechnology;2016

3. What is Nanotechnology?;Nanotechnology;2011

4. Resist Requirements and Limitations for Nanoscale Electron-Beam Patterning;MRS Proceedings;2002

5. The First 130 Years of Electron Microscopy;Nanoscale Science and Technology;1998

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3