Thickness-Dependence of Surface Reconstruction on the (001) Surface of Ultrathin Silicon Nanosheets by Density Functional Tight Binding Simulations

Author:

Wu Lijun1,Chi Baoqian1,Shen Longhai1,Zhang Lin2,Yang Qi2

Affiliation:

1. School of Science, Shenyang Ligong University, Shenyang 110159, China

2. Key Laboratory for Anisotropy and Texture of Materials, Ministry of Education, Northeastern University, Shenyang 110819, China

Abstract

The influences of the thickness of ultrathin Si nanosheets on the (001) surface morphologies and charge distribution were identified by using density functional tight binding (DFTB) simulations. The differences in structure and electronic properties were elucidated on the basis of bond lengths, bond angle distribution, and arrangement patterns in (001) surface atoms of Si nanosheets with their thickness decreasing from 1.5 nm to 0.4 nm. The surface atoms in some nanosheets present perfect zig-zag patterns in their dimers. The amounts of the trimers are far less than those of the dimers in the surface. The formation of the dimers lowers the surface energy of the nanosheets. Analysis of Mülliken gross populations indicates that there is the charge transfer from the inner part of the nanosheet to the surface. The moving distance and direction of the surface atoms can affect the charge distribution.

Publisher

American Scientific Publishers

Subject

General Materials Science

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