First Principles Based Investigation of Materials for Resistive RAM-Reference-Cited by-同舟云学术

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First Principles Based Investigation of Materials for Resistive RAM

Published:2008-10-01 Issue:10 Volume:5 Page:1976-1979
ISSN:1546-1955
Container-title:Journal of Computational and Theoretical Nanoscience
language:en
Short-container-title:Jnl of Comp & Theo Nano

Author:

Kishi Hirofumi,Kishi Tomoya,Diño Wilson Agerico,Minamitani Emi,Akinaga Hiro,Nakanishi Hiroshi,Kasai Hideaki

Publisher

American Scientific Publishers

Subject

Electrical and Electronic Engineering,Computational Mathematics,Condensed Matter Physics,General Materials Science,General Chemistry

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface as a Foundation to Realizing Designer Materials;e-Journal of Surface Science and Nanotechnology;2014

2. Realization of the Switching Mechanism in Resistance Random Access Memory™ Devices: Structural and Electronic Properties Affecting Electron Conductivity in a Hafnium Oxide–Electrode System Through First-Principles Calculations;Journal of Electronic Materials;2012-10-02

3. Oxygen vacancy effects on electronic structure of Pt/NiO/Pt capacitor-like system;Surface Science;2012-02

4. Controllability of Electrical Conductivity by Oxygen Vacancies and Charge Carrier Trapping at Interface between CoO and Electrodes;Japanese Journal of Applied Physics;2011-07-20

5. Controllability of Electrical Conductivity by Oxygen Vacancies and Charge Carrier Trapping at Interface between CoO and Electrodes;Japanese Journal of Applied Physics;2011-07-01

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