Thermal-Safe Dynamic Test Scheduling Method Using On-Chip Temperature Sensors for 3D MPSoCs
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Published:2012-12-01
Issue:5
Volume:8
Page:684-695
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ISSN:1546-1998
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Container-title:Journal of Low Power Electronics
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language:en
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Short-container-title:Journal of Low Power Electronics
Author:
Pasumarthi Rama Kumar,Devanathan V. R.,Visvanathan V.,Potluri Seetal,Kamakoti V.
Publisher
American Scientific Publishers
Subject
Electrical and Electronic Engineering
Cited by
1 articles.
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1. ProWATCh;ACM Journal on Emerging Technologies in Computing Systems;2015-09-21