Author:
Das Debesh Kumar,Ohtake Satoshi,Fujiwara Hideo
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by
1 articles.
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1. Hybrid non scan with built-in self-test for fault coverage improvement;5TH INTERNATIONAL CONFERENCE ON ELECTRICAL, ELECTRONIC, COMMUNICATION AND CONTROL ENGINEERING (ICEECC 2021);2023