The Formation of Defect Complexes in a ZnO Grain Boundary-Reference-Cited by-同舟云学术

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The Formation of Defect Complexes in a ZnO Grain Boundary

Published:2004-04 Issue:2/3 Volume:12 Page:227-234
ISSN:0927-7056
Container-title:Interface Science
language:en
Short-container-title:Interface Science

Author:

Domingos H.S.,Carlsson J.M.,Bristowe P.D.,Hellsing B.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defectivity of Al:ZnO thin films with different crystalline order probed by Positron Annihilation Spectroscopy;Applied Surface Science;2024-08

2. Genetic algorithm assisted multiscale modeling of grain boundary segregation of Al in ZnO and its correlation with nominal dopant concentration;Journal of the European Ceramic Society;2024-02

3. Defect-dependent environmental stability of high mobility transparent conducting In-doped CdO;Journal of Applied Physics;2024-01-23

4. ZnO Varistors: From Grain Boundaries to Power Applications;Oxide Electronics;2021-04-30

5. Temperature dependence and defect related structure, photoluminescence, (ferro)magnetism and ammonia sensitivity of un-doped nanocrystalline ZnO;Materials Science and Engineering: B;2020-12

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