Defectivity of Al:ZnO thin films with different crystalline order probed by Positron Annihilation Spectroscopy-Reference-Cited by-同舟云学术

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Defectivity of Al:ZnO thin films with different crystalline order probed by Positron Annihilation Spectroscopy

Published:2024-08 Issue: Volume:665 Page:160240
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Magrin Maffei R.^ORCID,Butterling M.^ORCID,Liedke M.O.^ORCID,D’Addato S.^ORCID,di Bona A.^ORCID,Bertoni G.,Gazzadi G.C.,Mariazzi S.,Wagner A.^ORCID,Brusa R.S.,Benedetti S.

Publisher

Elsevier BV

Reference75 articles.

1. Transparent Conductive Zinc Oxide;Ellmer,2008

2. Past achievements and future challenges in the development of optically transparent electrodes;Ellmer;Nature Photon.,2012

3. Alternative plasmonic materials: beyond gold and silver;Naik;Nature Photon.,2013

4. Transparent conducting oxide films for various applications: a review;Afre;Rev. Adv. Mater. Sci.,2018

5. Review of ZnO transparent conducting oxides for solar applications;Chen;IOP Conf. Ser.: Mater. Sci. Eng.,2018

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