Microstructure Development and Tribological Behavior in AlCuFe Quasicrystalline Thin Films-Reference-Cited by-同舟云学术

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Microstructure Development and Tribological Behavior in AlCuFe Quasicrystalline Thin Films

Published:2004-10 Issue:3 Volume:17 Page:435-443
ISSN:1023-8883
Container-title:Tribology Letters
language:en
Short-container-title:Tribology Letters

Author:

Fehrenbacher L.,Zabinski J.S.,Phillips B.S.,Daniels M.J.,King D.,Ketola K.S.,Bilello J.C.

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanical Engineering,Mechanics of Materials

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research Progress on Al-based Quasicrystal Films/coatings;CHINA SURF ENG;2021

2. Sputter deposition with powder targets: An overview;Vacuum;2021-02

3. Mechanical and tribological properties of AlCuFe quasicrystal and Al(Si)CuFe approximant thin films;Journal of Materials Research;2015-12-28

4. Atomic scale friction and adhesion properties of quasicrystal surfaces;Journal of Physics: Condensed Matter;2008-07-11

5. Microstructure and Chemistry of Annealed Al–Cu–Fe–Cr Quasicrystalline Approximant Coatings;Journal of Materials Research;2005-01

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