Author:
Keim Martin,Drechsler Nicole,Drechsler Rolf,Becker Bernd
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by
5 articles.
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2. Functional Test Generation;Evolutionary Algorithms for Embedded System Design;2003
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5. Emulation-based design errors identification;17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.