Chemical State Analysis of Fine Particles using XAFS-Reference-Cited by-同舟云学术

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Chemical State Analysis of Fine Particles using XAFS

Published:2007 Issue:2 Volume:93 Page:132-137
ISSN:1883-2954
Container-title:Tetsu-to-Hagane
language:ja
Short-container-title:Tetsu-to-Hagane

Author:

MATSUMOTO Satoshi,ISHII Hideshi,TANABE Teruo,KAWAI Jun

Publisher

Iron and Steel Institute of Japan

Subject

Materials Chemistry,Metals and Alloys,Physical and Theoretical Chemistry,Condensed Matter Physics

Link

http://www.jstage.jst.go.jp/article/tetsutohagane/93/2/93_2_132/_pdf

Reference30 articles.

1. 1) 岩坂泰信 : 「黄砂その謎を追う」, 紀伊國屋書店, 東京, (2006).

2. 2) 日本エアロゾル学会編 : 「エアロゾル用語集」京都大学学術出版会, 京都市, (2004).

3. The kinetics of the cure of an advanced epoxy resin by Fourier transform Raman and near-IR spectroscopy

4. Depth-Selective Chemical State Analysis of Fine Particles Using X-ray Absorption

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Synchrotron Radiation Experiments;X-Ray Spectroscopy for Chemical State Analysis;2022-12-16

2. Application of Extended X-Ray Emission Fine Structure Spectroscopy in Soil and Sediments;Synchrotron-Based Techniques in Soils and Sediments;2010

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