X-ray absorption fine structure study on the formation of Cu–Br bonds in (Br + Cu) ion implanted silica glass

Author:

Fukumi Kohei,Chayahara Akiyoshi,Kinomura Atsushi,Kageyama Hiroyuki,Kadono Kohei,Kitamura Naoyuki,Nishii Junji,Horino Yuji

Abstract

The valence and coordination structure of implanted Cu and Br ions were investigated by x-ray absorption fine structure spectroscopy in (2.4 MeV 6 × 1016 Br2+ ions cm−2+ 2 MeV 6 × 1016 Cu+ ions cm−2)-implanted silica glass. It was found that the implanted Cu and Br atoms were coordinated by oxygen atoms and silicon atoms, respectively, in as-implanted glass. After heating at 600 °C, at least two-thirds of the Cu atoms were coordinated by Br atoms without the formation of crystals. The γCuBr crystal was formed after heating to 1100 °C. It was deduced that the coordination structure of Cu and Br atoms depends on defects as well as thermochemical stability and mass transport processes.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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