Kinetics and Thermal Stability of Ni/Zr Multilayer Thin-Film Diffusion Couple during a Solid State Amorphization Reaction-Reference-Cited by-同舟云学术

Kinetics and Thermal Stability of Ni/Zr Multilayer Thin-Film Diffusion Couple during a Solid State Amorphization Reaction

Published:1986 Issue: Volume:77 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Meng W. J.,Cotts E. J.,Johnson W. L.,Keck W. M.

Abstract

ABSTRACTDifferential scanning calorimetry and X-ray diffraction have been utilized to monitor the solid state amorphization reaction in crystalline Ni/Zr multilayers. Enthalpy of mixing of amorphous NiZr alloys has been measured. Kinetics of amorphous phase formation and thermal stability have been discussed in some detail.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference12 articles.

1. Study of the enthalpies of formation and crystallization in the system Zr‐Ni

2. Solid State Reaction of Sputter Deposited Crystalline Multilayers of Ni and Zr

3. Transmission electron microscopic observations of amorphous NiZr alloy formation by solid‐state reaction

4. Formation of an Amorphous Alloy by Solid-State Reaction of the Pure Polycrystalline Metals

5. Micromechanism for Metallic-Glass Formation by Solid-State Reactions

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Metastable Phase Formation by Interdiffusion;MRS Proceedings;1993

2. Kinetics of Solid-State Reactions in Ni-Zr Thin Films;MRS Proceedings;1991

3. Kinetics of the solid‐state amorphizing reaction in thin films studied by electrical resistivity;Applied Physics Letters;1989-07-03

4. Maximum thickness of amorphous NiZr interlayers formed by a solid‐state reaction technique;Applied Physics Letters;1987-11-23