Epitaxial Growth Of Platinum-Group Metal Silicides On (111) SI

Author:

Chang Y. S.,Chu J. J.,Chen L. J.

Abstract

ABSTRACTEpitaxial ruthenium, osmium, rhodium and iridium suicides have been successfully grown on silicon. Electroless chemical plating was used to deposit platinum-group metal thin films on silicon. Two step annealing was found to be effective in inducing the growth and improving the quality of the epitaxial suicide on silicon.Transmission electron microscopy was applied to characterize the microstructures and determine the orientation relationships between epitaxial suicides and substrate Si. The compositions of deposited films were determined by scanning Auger electron spec-troscopy combined with depth profiling technique. The percentages of phosphorus were found to be in the range of 2–3 at. %.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Interfaces;Materials Science and Technology;2013-02-15

2. Transition metal silicides in silicon technology;Reports on Progress in Physics;1993-11-01

3. Phase formation and identification of an epitaxial Fe‐Ni alloy silicide;Journal of Applied Physics;1989-01

4. Local epitaxy of TiSi2on (111)Si: Effects due to rapid thermal annealing and to the annealing atmosphere;Journal of Applied Physics;1986-11

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