Author:
Vanlandingham M. R.,McKnight S. H.,Palmese G. R.,Bogetti T. A.,Eduljee R. F.,Gillespie J. W.
Abstract
ABSTRACTThe use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation. In this paper, a novel technique is used to probe local property changes in multi-component polymer systems. Changes in indentation response in interphase regions are investigated for an adhesive system involving a diffuse polymer-polymer bond and for two composite systems. To date, diamond-tipped probes with effective spring constants of 150 and 310 N/m have been used to investigate polyimide and epoxy resin matrices reinforced by carbon fibers.
Publisher
Springer Science and Business Media LLC
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