Author:
Potter Richard,Awad Ahmed,Chalker Paul R.,Wang Peng,Jones Anthony C.,Noakes Timothy C.Q.,Bailey Paul
Abstract
AbstractThe synthesis of SrBi2Ta2O9 (SBT) thin films has been investigated using a superlattice approach. Thin films were deposited on silicon by independent injection of each source to produce Bi2O3/SrTa2O6 superlattices. The effects of post-deposition annealing have been investigated using high-resolution TEM and medium energy ion scattering (MEIS) to depth profile the superlattices. X-ray diffraction has also been used to characterize the conversion of the superlattices from distinct layers of Bi2O3 and SrTa2O6 into a polycrystalline layer of strontium bismuth tantalate.
Publisher
Springer Science and Business Media LLC