Author:
Tietz L. A.,Carter C. B.,Lathrop D. K.,Russek S. E.,Buhrman R. A.
Abstract
ABSTRACTGrain boundaries in YBa2Cu3O7−x. thin films deposited on yttria-stabilized cubic zirconia have been characterized using selected-area diffraction. In addition to twin boundaries, several types of low-angle and high-angle grain boundaries are frequently found in these films. The high-angle boundaries include 23.5°, 29°, and 45° rotations about [001] and 90° rotations about [100] or [010]. These boundaries are compared to special high-angle grain boundaries in cubic materials.
Publisher
Springer Science and Business Media LLC
Cited by
11 articles.
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