Comparative Study of Microstructural Properties for YBa2Cu3O7 Films on Single-crystal and Ni-based Metal Substrates

Abstract

We conducted a comparative study of microstructural properties for YBa2Cu3O7 (YBCO) films on single-crystal MgO and polycrystalline Ni-based metal substrates with ion-beam-assisted deposited (IBAD) MgO as a template. The film grown on the metal substrate shows more crystalline imperfections with density of screw dislocations four times higher than that of the film on single-crystal MgO, as revealed by high-resolution x-ray diffraction (HRXRD). These high-density screw dislocation cores connect well and form bigger clustered grains as detected by scanning tunneling microscopy. Transmission electron microscopy studies confirm that the structural quality of YBCO on the Ni-based alloy is comparable to that on single-crystal MgO. All these factors contribute to our routine fabrication of high-quality YBCO films on metal substrates with critical current densities in self-field as high as those for the films grown on single-crystal MgO substrates. Superconducting properties in fields are also discussed.