Epitaxial CeO2 on Silicon Substrates and the Potential of Si/CeO2/Si for SOI Structures

Author:

Morshed A. H.,Liu S. X.,Leonard R.,Mcintosh F. G.,El-Masry N. A.,Bedair S. M.

Abstract

ABSTRACTCeO2 is nearly lattice matched to Si and has the CaF2 cubic structure thus it offers the potential for the epitaxial growth of an insulating film on Si. Laser ablation of a CeO2 target in an ultra high vacuum system was used for the deposition of single crystal CeO2. The effect of post growth thermal and rapid thermal annealing in O2, N2 and Ar atmosphere was found to have pronounced effects on the electrical properties measured by C-V and the optical properties measured by photoluminescence.We report on our initial results for the growth of epitaxial Si on the deposited CeO2 using low pressure CVD. Both RHEED and TEM studies showed that single crystal epitaxial Si was deposited on CeO2. The details of the Si deposition on CeO2 films for potential of SOI (silicon on insulator) structures will be discussed.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Five-nanometer thick silicon on insulator layer;Journal of Applied Physics;2005-11-15

2. Lattice-matched, epitaxial, silicon-insulating lanthanum yttrium oxide heterostructures;Applied Physics Letters;2002-02-04

3. Preparation of ceria films by spray pyrolysis method;International Journal of Inorganic Materials;2000-06

4. Production of metal oxide thin films by pulsed arc molecular beam deposition;Review of Scientific Instruments;2000-05

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