Author:
Kotecha Rutvij,Davison Gilpin A.,Jayasinghe Chaminda,Schulz Mark,Shanov Vesselin
Abstract
ABSTRACTCNT arrays were synthesized by Chemical Vapor Deposition (CVD) and spun into ribbons, which were coated using Atmospheric Pressure Microwave Plasma system. Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) characterization of CNT ribbons indicated the presence of polymer films with CF2 as a repeat unit. Atomic concentration of C, F and O in the coated films was estimated from X-ray Photoelectron Spectroscopy (XPS) data. Types of bonding between the elements in the coated films was studied by curve fitting of C 1s XPS spectra.
Publisher
Springer Science and Business Media LLC
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