1. T. S. Böscke, J. Müller, D. Bräuhaus, U. Schröder, and U. Böttger, Appl. Phys. Lett. 99, 10 (2011).
2. [2]T. Mikolajick, S. Slesazeck, M. Park, and U. Schroeder, MRS Bulletin, 43, 340–346 (2018).
3. M. H. Park, Y. H. Lee, H. J. Kim, Y. J. Kim, T. Moon, K. D. Kim, J. Müller, A. Kersch, U. Schroeder, T. Mikolajick, and C. S. Hwang, , Adv. Mater., 27, 1811–1831 (2015).
4. M. Jerry, P. Y. Chen, J. Zhang, P. Sharma, K. Ni, S. Yu, and S. Datta in Electron Devices Meeting (IEDM), (IEEE International Electron Device Meeting (IEDM) San Francisco, CA, 2017) pp. 6.2.1–6.2.4.
5. A. Aziz, E. T. Breyer, A. Chen, X. Chen, S. Datta, S. K. Gupta, M. Hoffmann, X. S. Hu, A. Ionescu, M. Jerry, and T. Mikolajick in Design, Automation & Test in Europe Conference & Exhibition (DATE, IEEE, 2018) pp. 1289–1298.