Probability of Detection of Internal Voids in Structural Ceramics Using Microfocus Radiography-Reference-Cited by-同舟云学术

Probability of Detection of Internal Voids in Structural Ceramics Using Microfocus Radiography

Published:1985 Issue: Volume:60 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Baaklini George Y.,Roth Don J.

Abstract

AbstractThe reliability of mlcrofocus x-rad1ogrphy for detecting Internal voids 1n structural ceramic test specimens was statistically evaluated. The micro-focus system was operated in the projection mode using low x-ray photon energies (≤;20 keV) and a 10 μm focal spot. The statistics were developed for Implanted Internal voids 1n green and sintered silicon carbide and silicon nitride test specimens. These statistics were compared with previously-obtained statistics for implanted surface voids in similar specimens. Statistical results are given as probability-of-detection curves at a 95 percent confidence level for voids ranging in size from 20 to 528 μm in diameter.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference14 articles.

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2. Probability of Detection of Internal Voids in Structural Ceramics Using Microfocus Radiography

3. 5. Baaklini G.Y. , Kiser J.D. , and Roth D.J. , Radiographic DetectabiHty Limits for Seeded Voids in Sintered Silicon Carbide and Silicon Nitride, Advanced Ceramic Materials, 1[1] 00–00 (1986). (NASA TM-86945)

4. Overview of U.S. Department of Energy Ceramic Gas Turbine Program

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1. On-Line NDE for Control and Modeling of Ceramic Processing;MRS Bulletin;1988-04

2. Probability of Detection of Internal Voids in Structural Ceramics Using Microfocus Radiography;MRS Proceedings;1985