Author:
Berjee Ratnabali,Bandyopadhyay A. K.,Sharma S. N.,Patabyal A. K.,Barua A.K.
Abstract
AbstractResults on characterisation of undoped, μc-Si:H films prepared by rf magnetron sputtering technique are presented. Highly conducting films (10−3 Δ−cm−1) were obtained at fairly low rf power density (l.2W/cm2). Critical parameters for obtaining microcrystalline phase were identified. The effect of humid ambient on film properties was looked into.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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