Modulation Spectroscopy of Layered Structures

Abstract

AbstractModulation spectroscopies, such as electroreflectance and photoreflectance have become popular as room temperature probes of layered structures. Because of their derivative nature, one observes sharp optical features related to critical points in the dielectric function of the material under study. This allows us to obtain information such as alloy concentration, carrier density, well widths of quantum wells and thicknesses of the constituent layers in superlattices. In this paper, we will review the application of modulation spectroscopy to the study of optical and electronic properties of layered structures.