Author:
Farlow G. C.,Appleton B. R.,Boatner L. A.,Mchargue C. J.,White C. W.,Clark G. J.,Baglin J. E. E.
Abstract
ABSTRACTSeveral different insulating substrates were coated with various metal films and ion beam irradiated using either Xe or Kr ions. These were then examined by Rutherford backscattering spectroscopy and scanning electron microscopy to determine if interfacial mixing had taken place. These results were compared with the sign of the reaction enthalpy of the metal and substrate to test the proposition that metals mix on insulators if the reaction enthalpy is negative and do not mix if it is positive. The enthalpy rule is in general valid. Two exceptions were found: Cr on Si02 and Zr on Al203; however, these exceptions contain ambiguous features.Irradiation with a light, reactive ion was found to produce no mixing.
Publisher
Springer Science and Business Media LLC
Cited by
17 articles.
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