Afm Probe Tip and Image Reconstruction from Noisy Measurements

Abstract

AbstractWe have tested the application of a recently developed probe tip reconstruction method to AFM images from semiconductor surfaces. The method by Villarrubia is the first to enable the construction of a probe tip from the AFM measurements alone. Here is a summary on how this method can be implemented. Experience shows that for some real surface data, experimental noise prevents the reconstruction of realistic tips. Therefore we present some preliminary results of how noise reduction methods applied to the measurements can provide access to more realistic tip shapes which are the basis for a useful image reconstruction.