Author:
Kim K.C.,Kang S.W.,Kryliouk O.,Anderson T.J.,Craciun D.,Craciun V.,Singh R.K.
Abstract
AbstractZnO films were deposited by Pulsed Laser Deposition (PLD) onto silicon substrates to serve as a buffer layer for GaN films grown by MOCVD. A ZnO buffer layer was found to improve the quality of GaN grown on Si. The thermal stability of ZnO as a buffer layer was also examined. It was determined that exposure of ZnO/Si to NH3 at high temperature (> 600°C) results in the decomposition of ZnO and subsequent poor nucleation of GaN. The ZnO layer thickness on GaN quality was found to be important.
Publisher
Springer Science and Business Media LLC
Cited by
2 articles.
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