1.54 μm Photoluminescence and Electroluminescence in Erbium Implanted 6H SiC

Author:

Yoganathan M.,Choyke W. J.,Devaty R. P.,Pensl G.,Edmond J. A.

Abstract

AbstractPhotoluminescence in the neighborhood of 1.54μm due to the 4I13/24l15/2 transitions is observed from 2 K up to 520 K in erbium implanted 6H SiC. The integrated 1.54 μm photoluminescence (PL) intensity is almost constant from 2 K up to about 400 K, with slight sample to sample variation. The shallow nitrogen donors play an important role in the excitation of the Er3+ centers. 1.54 μm electroluminescence (EL) is observed in erbium implanted 6H SiC p-n junctions under forward bias conditions. The EL spectrum is identical to the PL spectrum.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference9 articles.

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2. Luminescence Properties of Yb- and Nd- Implanted CdS

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4. Intense erbium‐1.54‐μm photoluminescence from 2 to 525 K in ion‐implanted 4H, 6H, 15R, and 3C SiC

5. Optical Activation of Ion Implanted Rare-Earths

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