Author:
Billman C. A.,Tan P. H.,Hubbard K. J.,Schlom D. G.
Abstract
ABSTRACTHigh K (dielectric constant) and silicon-compatibility are essential for an alternative gate dielectric for use in silicon MOSFETs. Thermodynamic data were used to comprehensively evaluate the thermodynamic stability of binary oxides and binary nitrides in contact with silicon at 1000 K. Using the Clausius-Mossotti equation and ionic polarizabilities, the K of all known inorganic compounds composed of Si-compatible binary oxides was estimated. A ranked list of alternate gate oxide candidates that are likely to possess both high K and silicon-compatibility is given.
Publisher
Springer Science and Business Media LLC
Cited by
27 articles.
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