Author:
Maaza M.,Gorenstein A.,Sella C.,Bridou F.,Pardo B.,Corno J.,Rogera G.,Bohnke O.,Julien C.
Abstract
AbstractIn this work, we investigate the influence of surface roughness on the kinetics of Li+ during the insertion process in the well-known electrochromic material WO3. Thin films 500 Å thick have been grown by rf-sputtering and annealed in therange of 25-350ºC. Grazing angle X-ray reflectometry shows that the film roughnessincreases considerably with thermal treatment. These measurements are correlated with chemical diffusion investigations obtained by electrochemical titration in Li/WO3 cells.
Publisher
Springer Science and Business Media LLC
Cited by
1 articles.
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