Automatic characterization of layers stacks from reflectivity measurements. Application to the study of the validity conditions of grazing X-rays reflectometry-Reference-Cited by-同舟云学术

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Automatic characterization of layers stacks from reflectivity measurements. Application to the study of the validity conditions of grazing X-rays reflectometry

Published:1990-07 Issue:4 Volume:21 Page:183-191
ISSN:0150-536X
Container-title:Journal of Optics
language:
Short-container-title:J. Opt.

Author:

Bridou F,Pardo B A

Publisher

IOP Publishing

Reference10 articles.

1. Recherches sur la propagation des ondes électromagnétiques sinusoïdales dans les milieux stratifiés

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