Optical Characterization of the Visible Photoluminescence from Porous Silicon-Reference-Cited by-同舟云学术

Optical Characterization of the Visible Photoluminescence from Porous Silicon

Published:1991 Issue: Volume:256 Page:
ISSN:0272-9172
Container-title:MRS Proceedings
language:en
Short-container-title:MRS Proc.

Author:

Fuchs H. D.,Brandt M. S.,Stutzmann M.,Weber J.

Abstract

ABSTRACTThe visible photoluminescence of electrochemically etched silicon wafers is studied by cw- and pulsed-laser excitation. Raman data and infrared transmission measurements on the same samples prove the presence of oxygen and hydrogen in different bonding configurations in the luminescent layers. Identical optical properties are found for chemically synthesized siloxene (Si6O3H6) and its derivates. We present evidence that the origin of the strong room temperature luminescence in “porous” silicon can be traced to siloxene derivates present in the samples.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

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