Radiation Defect Study in the P-Type Copper Seleind

Author:

Marchuk N. D.,Dolgolenko A. P.

Abstract

ABSTRACTP-Cu2-δ Se(δ=0.025) samples, self-doped through a departure from the stoichiometry(po= 4.8·1020) and cadmium-doped up to a concentration po= 5.6·1020cm−3 were studied in the course of their irradiation in a reactor up to a fluance of -6·1020 n·cm−2 of fast neutrons at a temperature of -500-550° C. The dependence of the resistivity and thermo-emf on the fast neutron fluence is described in terms of the theory of effective medium and representation of defect clusters as dielectric inclusions in a conducting matrix of p-Cu2Se(Cd) and p-Cu2_δSe samples.Defect clusters of a mean radius of -27 Å are shown to appear not only because of scattering of the fast pile neutrons on copper and selenium atoms, but also due to a nuclear reaction 112Cd(n,γ)114Cd on thermal neutrons with an efficiency of 3.43 cm−1. Increase of the conductivity in the process of the reactor irradiation of p-Cu2-δSe at small fluences of fast neutrons and appearance of a whitish deposit of selenium on the surface of samples after high fluences of fast neutrons were observed.

Publisher

Springer Science and Business Media LLC

Subject

General Engineering

Reference12 articles.

1. 12. Dolgolenko A.P. On mean defect concentration in clusters created by fast pile neutrons in n-Si. KIJaI preprint 76–23. Radiation effects in silicon, pp.12–13.

2. Evidence for spike-effects in low-energy heavy-ion bombardment of Si and Ge

3. Behavior of boron and phosphorus impurities in silicon in neutron irradiation and subsequent annealings.;Akhmetov;Fiz. Tekhn. Polupr.,1988

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